Detection of Defects in Soybean Seeds by Extracting Deep Features with SqueezeNet
Yazarlar (4)
Murat Koklu Selçuk Üniversitesi, Türkiye
Öğr. Gör. Ramazan Kursun Selçuk Üniversitesi, Türkiye
Doç. Dr. Yavuz Selim Taspinar Selçuk Üniversitesi, Türkiye
Bildiri Türü Tebliğ/Bildiri Bildiri Dili İngilizce
Bildiri Alt Türü Tam Metin Olarak Yayınlanan Tebliğ (Uluslararası Kongre/Sempozyum)
Bildiri Niteliği Alanında Hakemli Uluslararası Kongre/Sempozyum
DOI Numarası 10.1109/IDAACS58523.2023.10348939
Kongre Adı IEEE 12th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS)
Kongre Tarihi 07-09-2023 / 09-09-2023
Basıldığı Ülke Almanya Basıldığı Şehir Dortmund
Bildiri Linki https://doi.org/10.1109/idaacs58523.2023.10348939
UAK Araştırma Alanları
Özet
A vital part of ensuring the quality of soybean products is detecting defects. The current study presents a five-category classification of soybean seed defects: broken, immature, intact, skin-damaged, and spotted soybean seeds. Our goal is to improve the overall quality of soybean products through accurately identifying and categorizing defects. Computer vision techniques and machine learning algorithms are combined comprehensively to achieve this goal. To begin with, soybean seed images are analyzed using the SqueezeNet model, a deep-learning architecture known for its efficiency in image analysis. Features extracted from soybeans indicate the types of defects they present and their key visual characteristics. Then, we applied three widely used machine learning algorithms, including Artificial Neural Network (ANN), Logistic Regression (LR), and Random Forest (RF), to classify soybean seed images. A …
Anahtar Kelimeler
soybean | machine learning | ANN | LR | RF | feature exraction | classification
BM Sürdürülebilir Kalkınma Amaçları
Atıf Sayıları
Scopus 6
Google Scholar 19
Detection of Defects in Soybean Seeds by Extracting Deep Features with SqueezeNet

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