Effect of ambient temperature on electrical properties of nanostructure n ZnO p Si heterojunction diode
Yazarlar (2)
Doç. Dr. Seval AKSOY PEHLİVANOĞLU Sinop Üniversitesi, Türkiye
Prof. Dr. Yasemin Çağlar Anadolu Üniversitesi, Türkiye
Makale Türü Özgün Makale (SSCI, AHCI, SCI, SCI-Exp dergilerinde yayınlanan tam makale)
Dergi Adı SUPERLATTICES AND MICROSTRUCTURES (Q2)
Dergi ISSN 0749-6036 Dergi Bilgileri (2012)
Dergi Tarandığı Indeksler SCI-Expanded
Makale Dili İngilizce Basım Tarihi 05-2012
Cilt / Sayı / Sayfa 51 / 5 / 613–625 DOI 10.1016/j.spmi.2012.02.018
Makale Linki http://linkinghub.elsevier.com/retrieve/pii/S0749603612000596
UAK Araştırma Alanları
Yarı İletkenler
Özet
The nanostructure n-ZnO/p-Si heterojunction diode was fabricated by sol–gel method. The structural and morphological properties of the nanostructure ZnO film have been investigated. The X-ray diffraction spectra indicated that the films are of polycrystalline nature. The scanning electron microscopy images indicate that the surface morphology of ZnO film is almost homogeneous and the ZnO film is consisted of the circular formed with coming together of the nanoparticles. The electrical characterization of nanostructure n-ZnO/p-Si heterojunction diode has been investigated by current–voltage characteristics. The ideality factor (n) of the diode was found for different ambient temperatures and the obtained 6.40 value for 296K is higher than unity due to the interface states between the two semiconductor materials and series resistance. The values of n increased with decreasing ambient temperature. The reverse …
Anahtar Kelimeler
ZnO | Nanostructure | Sol-gel | Heterojunction semiconductor diode | Current-voltage characteristics | Ideality factor
BM Sürdürülebilir Kalkınma Amaçları
Atıf Sayıları
Web of Science 56
Google Scholar 79
Effect of ambient temperature on electrical properties of nanostructure n ZnO p Si heterojunction diode

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